Achievements

List of Publications

1. Development of X-ray Microscopes and Applications to Material and Life Science

• H. Takano et al., AIP Conference Proceedings 1696, 020039 (2016).
• T. Hirotomo et al., AIP Conference Proceedings 1696, 020017 (2016).
• H. Takano et al., J. Synchrotron Rad. 21 (2014) 446-448.
• H. Takano et al., Appl. Phys. Lett. 104 (2014) 023108.
• Y. Kagoshima et al., J. Appl. Phys. 113, 214314 (2013).
• H. Takano et al., Jpn. J. Appl. Phys. 52, 040204 (2013).
• Y. Kagoshima et al., Appl. Phys. Lett. 101, 163102 (2012).
• T. Koyama et al., Rev. Sci. Instrum. 83, 013705 (2012).
• H. Takano et al., Proc. SPIE 8139, 81390D (2011).
• H. Takano et al., AIP Conf. Proc. 1365 (2011) 297-300.
• T. Koyama et al., AIP Conf. Proc. 1365 (2011) 100-103.
• T. Koyama et al., AIP Conf. Proc. 1365 (2011) 24-27.
• Y. Kagoshima et al., Jpn. J. Appl. Phys. 50 (2011) 022503.
• H. Takano et al., Applied Physics Express 4 (2011) 019102.
• H. Takano et al., Rev. Sci. Instrum. 81 (2010) 073702.
• H. Takano et al., Applied Physics Express 3 (2010) 076702.
• T. Tsuji et al., Jpn. J. Appl. Phys. 49 (2010) 030207.
• H. Takano et al., Journal of Physics: Conference Series 186 (2009) 012049.
• H. Takenaka et al., Journal of Physics: Conference Series 186 (2009) 012074.
• T. Koyama et al., Journal of Physics: Conference Series 186 (2009) 012066.
• T. Koyama et al., Applied Physics Express 1 (2008) 117003.
• T. Koyama et al., Spectrochimica Acta Part B 62 (2007) 603-607.
• T. Koyama et al., Jpn. J. Appl. Phys. 45 (2006) L1159-L1161.
• Y. Kagoshima et al., Jpn. J. Appl. Phys. 43 (2004) pp.L1449-L1451.
• T. Koyama et al., Jpn. J. Appl. Phys. 43 (2004) L421-L423.
• Y. Kagoshima et al., J. Phys. IV France 104 (2003) 49-52.
• S. Kimura, et al., Jpn. J. Appl. Phys. 41 (2002) L1013-L1015.
• Y. Kagoshima et al., Jpn. J. Appl. Phys. 41 (2002) 412-413.
• Y. Kagoshima et al., J. Synchrotron Rad. 9, 132---135. Copyright © International Union of Crystallography
• Y. Kagoshima et al., Jpn. J. Appl. Phys. 40 (2001) L1190-L1192.
• Y. Kagoshima et al., Jpn. J. Appl. Phys. 39 (2000) L433-L435.
• Y. Kagoshima et al., Nucl. Instrum. & Methods. A 467-468 (2001) 872-876.

2. Studies of Microstructure of Electronic Device Materials

• Y. Tsusaka et al., Rev. Sci. Instrum. 87 (2016) 023701.
• M. Hiraiwa et al., Jpn. J. Appl. Phys. 54, 025503 (2015).
• T. Senda et al., Jpn. J. Appl. Phys. 47 (2008) 6241-6246.
• K. Fukuda et al., Jpn. J. Appl. Phys. 45 (2006) 8542-8548.
• S. Takeda et al., J. Synchrotron Rad. 13, (2006) 373---377. Copyright © International Union of Crystallography
• J. Matsui et al., Nucl. Instrum. & Methods B 199 (2003) 15-28.
• Y. Tsusaka et al., Nucl. Instrum. & Methods B 199 (2003) 19-22.
• K. Yokoyama et al., Jpn. J. Appl. Phys. 41 (2002) 6094-6097.
• K. Yokoyama et al., Nucl. Instrum. & Methods A 467-468 (2001) 1205-1208.）
• S. Takeda et al., Nucl. Instrum. & Methods A 467-468 (2001) 974-977.
• S. Kimura, et al., Appl. Phys. Lett. 77 (2000) 1286-1288.
• Y. Tsusaka et al., Jpn. J. Appl. Phys. 39 (2000) L635-L637.

3. Study of High Spatial-Resolution X-ray Imaging by Phase Contrast

• K. Kobayashi et al., Appl. Phys. Lett. 78 (2001) 132-134.
• Y. Kagoshima et al., Jpn. J. Appl. Phys. 38 (1999) L470-L472.

4. Studies of Growth Mechanism of MOCVD film

• H. Omi et al., Applied Physics Express 2 (2009) 126503.
• H. Omi et al., Phys. Rev. B 79 (2009) 245319.
• H. Omi et al., Appl. Phys. Lett. 86 (2005) 263112-263114.
• T. Kawamura et al., J. Appl. Phys. 97 (2005) 084318.
• S. Fujikawa et al., Jpn. J. Appl. Phys. 44 (2005) L144-L146.
• S. Bhunia et al., Appl. Phys. Lett. 83 (2003) 3371-3373.
• T. Kawamura et al., Appl. Phys. Lett. 77 (2000) 996-998.

5. Construction of the Hyogo Prefectural Beamline in the SPring-8

• H. Takano, SPring-8 Research Frontiers 2008, 190.
• Y. Tsusaka et al., Nucl. Instrum. & Methods. A 467-468 (2001) 670-673.
• Y. Tsusaka et al., Jpn. J. Appl. Phys. 38 (1999) Suppl. 38-1, 616-619.